Alpha and Omega Semiconductor Introduces Ultra-Low Capacitance TVS Diode Series

Alpha and Omega Semiconductor Limited (AOS) (Nasdaq: AOSL), a designer, developer, and global supplier of a broad range of discrete power devices, wide band gap power devices, power management ICs, and modules, today introduced its AOZ8S205BLS Series transient voltage suppressor (TVS) diodes. These ultra-low capacitance TVS diodes are designed to meet the increasing ESD protection needs in today’s sensitive high-speed line and antenna-based applications. AOZ8S205BLS is engineered using AOS’ innovative high-trigger voltage TVS platform, combined with its advanced packaging and the series’ industry-leading low 0.075pF capacitance. It is ideal to protect high-speed serial interfaces such as USB4 v2.0 and Thunderbolt 5 that are used in a broad range of electronic systems.

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New AOZ8S205BLS TVS Diodes Deliver Superior ESD Protection for High-Speed Line, Thunderbolt 5, USB4 v2.0, and Antenna-based Applications (Photo: Business Wire)

Additional features that boost the protection capabilities of AOZ8S205BLS TVS diodes include lower insertion loss, reverse working voltages (VRWM) of 3.3V, 5V, and 24V, and accurate clamping voltage. The AOZ8S205BLS is a single-channel device housed in a 0.6x0.3mm leadless surface-mount device (SMD), which allows it to meet the small footprint requirement of a USB Type-C connector.

“At AOS, we recognized the need to increase the feature benefits of widely adopted 24V (VRWM) devices with high-trigger-voltages used for Short-to-VBUS protection in many computing industry designs. By offering ultra-low 0.075pF capacitance and high-trigger voltage in a single device with the introduction of the AOZ8S205BLS, AOS is delivering a space-saving and enhanced ESD protection solution to designers of high-speed interface and sensitive antenna applications,” said Charles Chen, Marketing Director at AOS. “Solving a challenging problem in our partners’ and customers’ electronic products, we designed our new TVS diode series to help significantly reduce ESD failure rates, further safeguarding systems while streamlining design efforts.”